IOMeter v2006.07.27 – IOps
Iometer is an I/O subsystem measurement and characterization tool for single and clustered systems. It was originally developed by the Intel Corporation and announced at the Intel Developers Forum (IDF) on February 17, 1998 – since then it got wide spread within the industry.
Meanwhile Intel has discontinued to work on Iometer and it was given to the Open Source Development Lab (OSDL). In November 2001, a project was registered at SourceForge.net and an initial drop was provided. Since the relaunch in February 2003, the project is driven by an international group of individuals who are continuesly improving, porting and extend the product.
The real test of this new controller was to answer the question of NCQ scaling. With an 8-channel controller,
would Samsung finally take advantage of stacked IO requests? Judging from the blue line above, the answer
is most definitely YES. With these numbers we would have expected better numbers in the PCMark OS tests.
The answer reveals itself when you consider that the above test is the only read-only IOMeter profile we use.
Let’s see what happens when we throw some writes in there (below):
With mixed writes, the 470 becomes overloaded to the point where NCQ becomes irrelevant.
Performance drops even below that of its predecessor.
Here the 470 plot hides behind that of the WD SiliconEdge Blue.
